SCD0287-13A

LENGTH: 0.500"+/-.001"
WIDTH: 0.360"+/-.001"
THICKNESS: 0.025"+/-.0005"
PARALLELISM: CONTROLLED BY THICKNESS TOLERANCE.
CORNER/EDGE BEVELS: LIGHT PROTECTIVE BEVEL ALL
SHARP EDGES.
FLATNESS: NOT SPECIFIED.
SURFACE QUALITY: 80-50 PER MIL-PRF-13830, 2 FACES
CRYSTALLOGRAPHIC ORIENTATION: a-PLANE OR m-PLANE,
WITH THE c-AXIS
PARALLEL TO THE
0.500" LONG EGDE
WITHIN 15 DEGREES.
COATING: NONE, NOT REQUIRED.

SCD1646-01A

LENGTH X WIDTH TOLERANCE: +/-.001"
THICKNESS: 0.0100"+/-.00025"
PARALLELISM: CONTROLLED BY WIDTH DIMENSION
ROLL-OFF: 0.050" MAX. INTO THE PLANE OF SUBSTRATE.
EDGE CHIPS: 0.030" MAX INTO THE PLANE OF SUBSTRATE
FLATNESS/BOW: < 0.0025"
SQUARENESS: EDGES SQUARE TO WITHIN 0.001"/INCH
SURFACE FINISH:
SIDE 1-EPI PER SPECIFICATION A-3980-9004-3
SIDE 2-FINE GROUND, 16 MICROINCH MAXIMUM
MATERIAL QUALITY: OPTICAL GRADE
CRYSTALLOGRAPHIC ORIENTATION: M-PLANE, WITH THE
C-AXIS PARALLEL TO THE 1.600" DIMENSION.

SCD1647-01A

LENGTH X WIDTH TOLERANCE: +/-.001"
THICKNESS: 0.0075"+/-.00025"
PARALLELISM: CONTROLLED BY WIDTH DIMENSION
ROLL-OFF: 0.007" MAX. INTO THE PLANE OF SUBSTRATE.
EDGE CHIPS: 0.010" MAX INTO THE PLANE OF SUBSTRATE
FLATNESS/BOW: < 0.0040"
SQUARENESS: EDGES SQUARE TO WITHIN 0.001"/INCH
SURFACE FINISH:
SIDE 1-EPI PER SPECIFICATION A-3980-9004-3
SIDE 2-FINE GROUND, 16 MICROINCH MAXIMUM
MATERIAL QUALITY: OPTICAL GRADE
CRYSTALLOGRAPHIC ORIENTATION: M-PLANE, WITH THE
C-AXIS PARALLEL TO THE 1.000" DIMENSION.
IDENTIFICATION CHAMFER: WITH POLISHED SIDE UP AND
THE LENGTH HORIZONTAL CHAMFER THE UPPER RIGHT
CORNER 0.035"+/-.015" X 45 Deg.

SCD1742-02B

CONFIGURATION: PLATE, RECTANGULAR, PLANE-PARALLEL
LENGTH: 19.834mm + 0.000mm /- 0.025mm
WIDTH: 6.350mm + 0.000mm /- 0.025mm
THICKNESS: 0.508mm +/- 0.008mm
CORNER BEVELS: 0.10mm MAXIMUM X 45deg,
4 PLACES.
EDGE BEVELS: 0.10mm MAXIMUM X 45deg, 8 PLACES.
EDGE SQUARENESS: 0.001mm MAXIMUM T.I.R.
PARALLELISM: < 0.10 MILLIRADIANS (21 ARC SECONDS)
TRANSMITTED WAVEFRONT: < 1.0 WAVE PEAK to VALLEY
(@ 633nm) WITHIN CLEAR APERTURE.
SURFACE QUALITY: 5-5 PER MIL-PRF-13830, 2 FACES.
CLEAR APERTURE: CENTRAL AREA DEFINED BY A 0.75mm
BORDER, IN FROM EDGES OF PART.
EDGE FINISH: FINE GROUND, NO CHIPS >0.05mm IN SIZE
MATERIAL TYPE/QUALITY: SAPPHIRE, OPTICAL GRADE.
CRYSTALLOGRAPHIC ORIENTATION: (0001) +/- 2 Deg.
COATING: NONE, NOT REQUIRED.

SCD2449-05B

DIAMETER: 3.000"+/-.050"
THICKNESS: 0.0200"+/-.0002"
PARALLELISM: 0.00015" MAXIMUM T.I.R.
OD FLAT WIDTH: 1.000"+/-.200"
OD FLAT LOCATION: RANDOM
FLATNESS: 20 FRINGES MAXIMUM, 2 FACES.
SURFACE FINISH: 80-50 PER MIL-PRF-13830, 2 FACES
FLATNESS: 20 FRINGES MAXIMUM, 2 FACES.
MATERIAL TYPE/QUALITY: SAPPHIRE, OPTICAL GRADE.
CRYSTALLOGRAPHIC ORIENTATION: c-PLANE +/- 2 deg.

SCD3353-02D

CONFIGURATION: DISC W/ OD FLAT, PLANE-PARALLEL
DIAMETER: 100.00mm +/- 0.10mm
OD FLAT SIZE: 32.50mm +/- 0.50mm
OD FLAT LOCATION: RANDOMLY LOCATED.
THICKNESS: 0.0423"+/-.0010"
PARALLELISM: 2.10 ARC MINUTES MAXIMUM.
EDGE BEVELS: 0.30mm MAXIMUM FACE WIDTH, 2 PLACES.
TWE: POWER: 4 WAVES MAXIMUM @ 633nm, 2 FACES
IRREG: 0.60 WAVE MAXIMUM @ 633nm, 2 FACES.
APPLIES OVER ANY 0.580" DIAMETER WITHIN C.A.
CLEAR APERTURE: CENTRAL 86.00mm MINIMUM DIAMETER.
SURFACE QUALITY: 60-40 PER MIL-PRF-13830, 2 FACES
SURFACE ROUGHNESS: < 0.70nm Ra, BOTH FACES.
MATERIAL TYPE/QUALITY: SAPPHIRE, OPTICAL GRADE.
CRYSTALLOGRAPHIC ORIENTATION: (0001) +/- 2deg
MARKING: SEQUENCIAL SERIALIZATION REQUIRED. "XXX"
(3 DIGITS) 0.100"HEIGHT, 180 DEGREES FROM
OD FLAT.
COATING: NONE, NOT REQUIRED.

SCD3440-02A

CONFIGURATION: DISC W/ OD FLAT, PLANE-PARALLEL
DIAMETER: 100.00mm +/- 0.10mm
OD FLAT SIZE: 32.50mm +/- 0.50mm
OD FLAT LOCATION: RANDOMLY LOCATED.
THICKNESS: 0.0395"+/-.0005"
PARALLELISM: 1 ARC MINUTE MAXIMUM.
EDGE BEVELS: 0.30mm MAXIMUM FACE WIDTH, 2 PLACES.
FLATNESS: PWR: 2 FRINGES MAXIMUM @ 633nm, 2 FACES
IRRG: 2 FRINGES MAXIMUM @ 633nm, 2 FACES
APPLIES OVER ANY 0.500" DIAMETER.
CLEAR APERTURE: CENTRAL 90.00mm MINIMUM DIAMETER.
SURFACE QUALITY: E-E PER ANSI/OEOSC OP1.002-2009,
BOTH FACES.
SURFACE ROUGHNESS: < 0.70nm Ra, BOTH FACES.
MATERIAL TYPE/QUALITY: SAPPHIRE, OPTICAL GRADE.
CRYSTALLOGRAPHIC ORIENTATION: (0001) +/- 2deg
COATING: NONE, NOT REQUIRED.

SCD3628-02A

CONFIGURATION: DISC W/ OD FLATS, PLANE-PARALLEL
DIAMETER: 100.00mm + 0.00mm /- 0.10mm
OD FLAT SIZES: 60.00mm PRIMARY / 39.20mm SECONDARY
OD FLAT LOCATIONS: 90 DEGREES SEPARATION.
THICKNESS: 1.00mm +/- 0.05mm
EDGE BEVELS: 0.20mm MAXIMUM X 45deg, BOTH FACES.
PARALLELISM: 5 ARC SECONDS MAXIMUM
TRANSMITTED WAVEFRONT: < 1 WAVE PER 25mm @ 633nm.
CLEAR APERTURE: CENTRAL 88.0mm DIAMETER ZONE.
SURFACE QUALITY: 20-10 PER MIL-PRF-13830, 2 FACES
MATERIAL TYPE/QUALITY: SAPPHIRE, HIGH PURITY,
KYROPULOS GROWN, OPTICAL
GRADE.
CRYSTALLOGRAPHIC ORIENTATION: (0001) +/- 2 DEGREES
COATING: NONE, NOT REQUIRED.

SCD4245-02B

Diameter: 100.00mm +/- 0.10mm Thickness: 0.994mm +/- 0.005mm Edge Bevel: Not Specified Parallelism: 0.010mm Maximum T.T.V. Over Any 24.00mm X 8.05mm Sub-Aperture Clear Aperture: Central 90mm Diameter, Both Faces T.W.F.E: 150nm RMS Maximum @ 633nm Over Any 24.00mm X 8.05mm Sub-Aperture Surface Roughness: 7 Angstroms RMS Maximum, Both Faces Surface Quality: 20-10 Per MIL-PRF-13830, Both Faces Material Type / Quality: Sapphire, Optical Grade Crystallographic Orientation: c-Plane Coating: None, Not Required

SCD4260-02B

Diameter: 82.55mm + 0.00mm /- 0.10mm Thickness: 5.00mm +/- 0.05mm Parallelism: < 5 Arc Seconds Edge Bevel: 0.20mm +/- 0.05mm X 45 Degrees, Both Edges Clear Aperture: Central 77.00mm Diameter, Both Faces Transmitted Wavefront Error: < 10 Nanometers RMS W FEt @ 633nm Surface Quality: 20-10 Per MIL-PRF-13830, Both Faces Surface Roughness: < 1.0 Nanometer RMS, Both Faces Material Type / Quality: Sapphire, Optical Grade Crystallographic Orientation: c-Plane +/- 10 Arc Minutes Coating: None, Uncoated Substrate