SCD3978-WIT

Diameter: 25.40mm + 0.00mm /- 0.10mm Thickness: 1.00mm +/- 0.05mm Parallelism: 3 Arc Minutes Maximum Edge Bevels: Light Protective Bevel, Both Edges Flatness: Power: 5 Fringes Maximum @ 633nm, Both Faces Irregularity: 1 Fringe Maximum @ 633nm, Both Faces Surface Quality: 80-50 Per MIL-PRF-13830, Both Faces Material Type / Quality: Sapphire, Optical Grade Same Boule Material as the Sapphire Domes (SCD3978-02A) Crystallographic Orientation: c-Plane Coating: None, Uncoated Substrate

SCD4190-WIT

Diameter: 25.40mm +/- 0.10mm Thickness: 3.00mm +/- 0.03mm Edge Bevel: Light Protective Bevel, Both Edges Parallelism: Not Specified Flatness: Not Specified Surface Quality: 5/5x0.1 Per ISO 10110 Part 8, Both Faces Surface Roughness: < 1.0nm Ra, Both Faces Material Type / Quality: Sapphire, Optical Grade From Same Boule as Used to Produce SCD4190-02A Crystallographic Orientation: c-Plane Coating: None, Uncoated Substrate

SCD4219-WIT

Diameter: 1.001"+/-.001" Thickness: 0.200"+/-.010" Parallelism: 5 Arc Seconds Maximum. Edge Bevels: 0.020"Maximum Face Width x 45 Degrees, Both Edges Flatness: < 0.30um RMS @ 633nm, Both Faces Surface Quality: 40-20 Per MIL-PRF-13830, Both Faces Surface Roughness: < 20 Angstroms RMS, Both Faces Clear Aperture: Not Specified Material Type / Quality: Sapphire, Optical Grade 1 or 2 Material to Be From Same Boule Used to Produce SCD4219-02A. Crystallographic Orientation: c-Plane Coating: None, Uncoated Substrate

SCD4260-WIT

Diameter: 25.00mm + 0.00mm /- 0.10mm Thickness: 3.00mm +/- 0.20mm Parallelism: Not Specified Edge Bevel: 0.50mm +/- 0.10mm X 45 Degrees, Both Edges Clear Aperture: Central 20.00mm Diameter, Both Faces Flatness: Not Specified Surface Quality: 2x0.025; C5x0.016 per ISO 10110, Both Faces Material Type / Quality: Sapphire, Optical Grade Crystallographic Orientation: c-Plane

SCD4267-02A

Sapphire Witness,25.40mmDia,UC

SCD4374-02A

Diameter: 25.40mm +.000/- 0.10mm Thickness: 3.10mm +/- 0.10mm Paralllelism: 5 Arc Minutes Maximum Edge Bevels: 0.20mm / 0.30mm x 45 Degrees, Both Edges Surface Accuracy: Power: 5 Fringes Maximum @ 633nm, Both Faces Irregularity: 3 Fringes Maximum @ 633nm, Both Faces Surface Quality: 60-40 per MIL-PRF-13830, Both Faces Material Type / Quality: Sapphire, Optical Grade Marking: "Al203" per Drawing T0026374 Coating: None, Not Required

SCD4375-WIT-UC

Diameter: 1.000"+/-.002" Thickness: 0.125"+/-.005" Edge Bevel: Light Protective Bevel, Both Edges Parallelism: 1 Arc Minute Maximum Flatness: 1/2 Wave Maximum@ 633nm, Both Faces Surface Quality: 60-40 Per MIL-PRF-13830, Both Faces Material Type / Quality: Sapphire, Optical Grade Crystallographic Orientation: c-Plane Coating: None, Uncoated Substrate

SCD4433-02A

Diameter: 25.00mm + 0.00mm /- 0.10mm Thickness: 3.00mm +/- 0.20mm Edge Bevel: 0.35mm +/- 0.10mm Face Width, Both Edges Parallelism: < 0.45 Arc Minutes Transmitted Wavefront Error: < 1/8 Wave RMS @ 1055nm Surface Quality: 20-10 per MIL-PRF-13830, Both Faces Surface Roughness: < 10 Angstroms RMS, Both Faces Clear Aperture: Central 22.00mm Minimum Diameter, Both Faces Material Type / Quality: Sapphire, Optical Grade, Crystallographic Orientation: c-Plane Coating: None, Not Required

SCD4460-WIT1

Witness Sample - Polished One Face Diameter: 36.00mm +/- 0.30mm Thickness: 6.98mm +/- 0.20mm Edge Bevel: Light Protective Bevel, Both Edges Parallelism: < 2 Arc Minutes Transmitted Wavefront Error: N/A Surface Quality: 60-40 per MIL-PRF-13830, One Face Other Face Fine Ground Surface Roughness: < 50 Angstroms RMS, Polished Face Clear Aperture: Central 29.62 Minimum Diameter, Both Faces Material Type / Quality: Sapphire, Optical Grade, GT Crystal Systems Low Absorption Optical Sapphire (LAOS) Crystallographic Orientation: c-Plane Coating: None, Not Required