SCD1742-02B

CONFIGURATION: PLATE, RECTANGULAR, PLANE-PARALLEL
LENGTH: 19.834mm + 0.000mm /- 0.025mm
WIDTH: 6.350mm + 0.000mm /- 0.025mm
THICKNESS: 0.508mm +/- 0.008mm
CORNER BEVELS: 0.10mm MAXIMUM X 45deg,
4 PLACES.
EDGE BEVELS: 0.10mm MAXIMUM X 45deg, 8 PLACES.
EDGE SQUARENESS: 0.001mm MAXIMUM T.I.R.
PARALLELISM: < 0.10 MILLIRADIANS (21 ARC SECONDS)
TRANSMITTED WAVEFRONT: < 1.0 WAVE PEAK to VALLEY
(@ 633nm) WITHIN CLEAR APERTURE.
SURFACE QUALITY: 5-5 PER MIL-PRF-13830, 2 FACES.
CLEAR APERTURE: CENTRAL AREA DEFINED BY A 0.75mm
BORDER, IN FROM EDGES OF PART.
EDGE FINISH: FINE GROUND, NO CHIPS >0.05mm IN SIZE
MATERIAL TYPE/QUALITY: SAPPHIRE, OPTICAL GRADE.
CRYSTALLOGRAPHIC ORIENTATION: (0001) +/- 2 Deg.
COATING: NONE, NOT REQUIRED.

SCD3440-02A

CONFIGURATION: DISC W/ OD FLAT, PLANE-PARALLEL
DIAMETER: 100.00mm +/- 0.10mm
OD FLAT SIZE: 32.50mm +/- 0.50mm
OD FLAT LOCATION: RANDOMLY LOCATED.
THICKNESS: 0.0395"+/-.0005"
PARALLELISM: 1 ARC MINUTE MAXIMUM.
EDGE BEVELS: 0.30mm MAXIMUM FACE WIDTH, 2 PLACES.
FLATNESS: PWR: 2 FRINGES MAXIMUM @ 633nm, 2 FACES
IRRG: 2 FRINGES MAXIMUM @ 633nm, 2 FACES
APPLIES OVER ANY 0.500" DIAMETER.
CLEAR APERTURE: CENTRAL 90.00mm MINIMUM DIAMETER.
SURFACE QUALITY: E-E PER ANSI/OEOSC OP1.002-2009,
BOTH FACES.
SURFACE ROUGHNESS: < 0.70nm Ra, BOTH FACES.
MATERIAL TYPE/QUALITY: SAPPHIRE, OPTICAL GRADE.
CRYSTALLOGRAPHIC ORIENTATION: (0001) +/- 2deg
COATING: NONE, NOT REQUIRED.

SCD3628-02A

CONFIGURATION: DISC W/ OD FLATS, PLANE-PARALLEL
DIAMETER: 100.00mm + 0.00mm /- 0.10mm
OD FLAT SIZES: 60.00mm PRIMARY / 39.20mm SECONDARY
OD FLAT LOCATIONS: 90 DEGREES SEPARATION.
THICKNESS: 1.00mm +/- 0.05mm
EDGE BEVELS: 0.20mm MAXIMUM X 45deg, BOTH FACES.
PARALLELISM: 5 ARC SECONDS MAXIMUM
TRANSMITTED WAVEFRONT: < 1 WAVE PER 25mm @ 633nm.
CLEAR APERTURE: CENTRAL 88.0mm DIAMETER ZONE.
SURFACE QUALITY: 20-10 PER MIL-PRF-13830, 2 FACES
MATERIAL TYPE/QUALITY: SAPPHIRE, HIGH PURITY,
KYROPULOS GROWN, OPTICAL
GRADE.
CRYSTALLOGRAPHIC ORIENTATION: (0001) +/- 2 DEGREES
COATING: NONE, NOT REQUIRED.

SCD4245-02B

Diameter: 100.00mm +/- 0.10mm Thickness: 0.994mm +/- 0.005mm Edge Bevel: Not Specified Parallelism: 0.010mm Maximum T.T.V. Over Any 24.00mm X 8.05mm Sub-Aperture Clear Aperture: Central 90mm Diameter, Both Faces T.W.F.E: 150nm RMS Maximum @ 633nm Over Any 24.00mm X 8.05mm Sub-Aperture Surface Roughness: 7 Angstroms RMS Maximum, Both Faces Surface Quality: 20-10 Per MIL-PRF-13830, Both Faces Material Type / Quality: Sapphire, Optical Grade Crystallographic Orientation: c-Plane Coating: None, Not Required

SCD4260-02B

Diameter: 82.55mm + 0.00mm /- 0.10mm Thickness: 5.00mm +/- 0.05mm Parallelism: < 5 Arc Seconds Edge Bevel: 0.20mm +/- 0.05mm X 45 Degrees, Both Edges Clear Aperture: Central 77.00mm Diameter, Both Faces Transmitted Wavefront Error: < 10 Nanometers RMS W FEt @ 633nm Surface Quality: 20-10 Per MIL-PRF-13830, Both Faces Surface Roughness: < 1.0 Nanometer RMS, Both Faces Material Type / Quality: Sapphire, Optical Grade Crystallographic Orientation: c-Plane +/- 10 Arc Minutes Coating: None, Uncoated Substrate