SCD2871-01A
$1,200.00
WAVEPLATE SAPPHIRE 1/4 WAVE
12.0mm DIA .55mm NOM THK 1.319
10 in stock
SKU: SCD2871-01A
Category: WAVEPLATE SAPPHIRE
CONFIGURATION: DISC, PLANE-PARALLEL
DIAMETER: 12.00 +/- 0.05mm
OD FLAT: 5.65mm FROM THE CENTER OF THE PART.
THICKNESS: 0.55mm TO YIELD RETARDATION TOL.
PARALLELISM: 2 ARC SECONDS MAXIMUM.
T.W.E: 1/8 WAVE MAXIMUM AT 632.8nm OVER CA.
RETARDATION TOLERANCE: +/- 1/500 WAVE
CLEAR APERTURE: CENTRAL 10.50 mm OF DIAMETER.
SURFACE FINISH: 40-20 PER MIL-PRF-13830, 2 FACES.
MATERIAL TYPE/QULAITY: SAPPHIRE, OPTICAL GRADE,
CSI HEMLITE ONLY.
CRYSTALLOGRAPHIC ORIENTATION: M-PLANE
COATING: ANTIREFLECTIVE “V” COAT FOR MAXIMUM
TRANSMISSION AT 1.319 MICRONS WITH A
NORMAL INCIDENCE ANGLE, APPLIED TO
BOTH FACES. SEE DRAWING FOR TEST DATA
REQUIRED.
| Weight | 0.1 lbs |
|---|
Related products
SCD1970-01A
CONFIGURATION: DISC, PLANE-PARALLELDIAMETER: 0.500"+.000"/-.005"
OD FLAT: NONE
THICKNESS: 0.022" NOMINAL TO YIELD RETARDATION TOL
PARALLELISM: 2 ARC SECONDS MAXIMUM.
T.W.E: 1/10 WAVE MAXIMUM AT 632.8nm.
RETARDATION TOLERANCE: +/- 1/400 WAVE
CLEAR APERTURE: CENTRAL 85% OF DIAMETER FACES.
MATERIAL TYPE/QUALITY: SAPPHIRE, OPTICAL GRADE.
CRYSTALLOGRAPHIC ORIENTATION: M-PLANE
COATING: ANTIREFLECTIVE "V" COAT FOR MAXIMUM
TRANSMISSION AT 1.064 MICRONS WITH A
NORMAL INCIDENCE ANGLE, APPLIED TO
BOTH FACES.
SCD1971-01A
SCD1971-01A CONFIGURATION: DISC, PLANE-PARALLEL DIAMETER: 0.500"+.000"/-.005" OD FLAT: NONE THICKNESS: 0.024" NOMINAL TO YIELD RETARDATION TOL PARALLELISM: 2 ARC SECONDS MAXIMUM. T.W.E: 1/10 WAVE MAXIMUM AT 632.8nm. RETARDATION TOLERANCE: +/- 1/400 WAVE CLEAR APERTURE: CENTRAL 85% OF DIAMETER FACES. MATERIAL TYPE/QUALITY: SAPPHIRE, OPTICAL GRADE. CRYSTALLOGRAPHIC ORIENTATION: M-PLANE COATING: ANTIREFLECTIVE "V" COAT FOR MAXIMUM TRANSMISSION AT 1.064 MICRONS WITH A NORMAL INCIDENCE ANGLE, APPLIED TO BOTH FACES.SCD1965-01B
CONFIGURATION: DISC, PLANE-PARALLELDIAMETER: 0.500"+.000"/-.010"
OD FLAT: NONE
THICKNESS: 0.022" NOMINAL TO YIELD RETARDATION TOL
PARALLELISM: 2 ARC SECONDS MAXIMUM.
T.W.E: 1/10 WAVE MAXIMUM AT 632.8nm.
RETARDATION TOLERANCE: +/- 1/1200 WAVE
CLEAR APERTURE: CENTRAL 85% OF DIAMETER FACES.
MATERIAL TYPE/QUALITY: SAPPHIRE, OPTICAL GRADE.
CRYSTALLOGRAPHIC ORIENTATION: M-PLANE
COATING: ANTIREFLECTIVE "V" COAT FOR MAXIMUM
TRANSMISSION AT 3.388 MICRONS WITH A
NORMAL INCIDENCE ANGLE, APPLIED TO
BOTH FACES.
SCD2719-01A
CONFIGURATION: DISC, PLANE-PARALLELDIAMETER: 0.500"+.000"/-.010"
OD FLAT: NONE
THICKNESS: 0.025" NOMINAL TO YIELD RETARDATION TOL
PARALLELISM: 2 ARC SECONDS MAXIMUM.
T.W.E: 1/10 WAVE MAXIMUM AT 632.8nm.
RETARDATION TOLERANCE: +/- 1/1200 WAVE
CLEAR APERTURE: CENTRAL 85% OF DIAMETER FACES.
MATERIAL TYPE/QUALITY: SAPPHIRE, OPTICAL GRADE.
CRYSTALLOGRAPHIC ORIENTATION: M-PLANE
COATING: ANTIREFLECTIVE "V" COAT FOR MAXIMUM
TRANSMISSION AT 3.175 MICRONS WITH A
NORMAL INCIDENCE ANGLE, APPLIED TO
BOTH FACES.
SCD3242-01A
SCD3242-01A CONFIGURATION: DISC, PLANE-PARALLEL DIAMETER: 0.500"+.000"/-.010" OD FLAT: NONE, NOT REQUIRED. THICKNESS: 0.0614" NOMINAL TO YIELD RETARDATION. PARALLELISM: 2 ARC SECONDS MAXIMUM. TRANSMITTED WAVEFRONT: 1/10 WAVE MAXIMUM AT 633nm. RETARDATION TOLERANCE: +/- 1/300 WAVE SURFACE QUALITY: 60-40 PER MIL-PRF-13830, 2 FACES. CLEAR APERTURE: CENTRAL 0.375" OF DIAMETER FACES. MATERIAL TYPE/QUALITY: SAPPHIRE, OPTICAL GRADE. CRYSTALLOGRAPHIC ORIENTATION: M-PLANE COATING: DUAL-BAND ANTIREFLECTIVE COAT MAXIMUM TRANSMISSION AT BOTH 1064nm AND ALSO 1595mm TO 1650nm WITH A NORMAL INCIDENCE ANGLE, APPLIED TO BOTH FACES.SCD2127-01A
SCD2127-01A CONFIGURATION: DISC, PLANE-PARALLEL DIAMETER: 0.500"+/-.002" MARKING: SMALL OD FLAT INDICATING THE PROJECTION OF THE C-AXIS. THICKNESS: 0.107" NOMINAL TO YIELD RETARDATION TOL EDGE BEVEL: 0.005" MAXIMUM X 45deg, 2 PLACES. RETARDATION: 83/2 WAVES AT 532 NANOMETERS. 59/2 WAVES AT 731.5 NANOMETERS. RETARDATION TOLERANCE: LAMBDA/300 MATERIAL TYPE/QUALITY: SAPPHIRE, OPTICAL GRADE. CRYSTALLOGRAPHIC ORIENTATION: M-PLANE COATING: DUALBAND ANTIREFLECTIVE COATING FOR LESS THAN 0.5% REFLECTANCE AT BOTH 532nm AND 731.5nm WITH A NORMAL INCIDENCE ANGLE, APPLIED TO BOTH FACES.SCD2350-01A
CONFIGURATION: DISC, PLANE-PARALLELDIAMETER: 70.00mm + 0.00mm /- 0.12mm
MARKING: SMALL OD FLAT INDICATING THE PROJECTION
OF THE C-AXIS.
THICKNESS: 3.2mm NOMINAL TO YIELD RETARDATION TOL
EDGE BEVEL: 0.13mm MAXIMUM X 45deg, 2 PLACES.
RETARDATION: 25 LAMBDA/4
RETARDATION TOLERANCE: LAMBDA/1000
SURFACE QUALITY: 60-40 PER MIL-PRF-13830, 2 FACES.
MATERIAL TYPE/QUALITY: SAPPHIRE, OPTICAL GRADE.
CRYSTALLOGRAPHIC ORIENTATION: M-PLANE
COATING: ANTIREFLECTIVE COATING FOR 0.50% MAXIMUM
REFLECTANCE PER SURFACE FROM 3.0 TO 5.0
MICRONS WITH A NORMAL INCIDENCE ANGLE,
APPLIED TO BOTH FACES.
SCD2940-01A
CONFIGURATION: DISC, PLANE-PARALLELDIAMETER: 1.000"+.000"/-.005"
OD FLAT: 0.375" WIDTH PERP.TO C-AXIS PROJECTION.
THICKNESS: 0.027" TO YIELD RETARDATION TOLERANCE.
PARALLELISM: 2 ARC SECONDS MAXIMUM.
T.W.E: 0.25 WAVE MAXIMUM AT 633nm OVER CA.
RETARDATION: 0.50 WAVE +/- 0.01 WAVE AT 3.338um.
CLEAR APERTURE: CENTRAL 0.800" DIAMETER.
SURFACE FINISH: 60-40 PER MIL-PRF-13830, 2 FACES.
MATERIAL TYPE/QUALITY: SAPPHIRE, OPTICAL GRADE,
CRYSTALLOGRAPHIC ORIENTATION: M-PLANE
COATING: ANTIREFLECTIVE COATED FOR 0.25% MAXIMUM
REFLECTANCE PER SURFACE AT 3.338 MICRONS
WITH A NORMAL INCIDENCE ANGLE, APPLIED
TO BOTH FACES.