SCD2940-01A

CONFIGURATION: DISC, PLANE-PARALLEL
DIAMETER: 1.000″+.000″/-.005″
OD FLAT: 0.375″ WIDTH PERP.TO C-AXIS PROJECTION.
THICKNESS: 0.027″ TO YIELD RETARDATION TOLERANCE.
PARALLELISM: 2 ARC SECONDS MAXIMUM.
T.W.E: 0.25 WAVE MAXIMUM AT 633nm OVER CA.
RETARDATION: 0.50 WAVE +/- 0.01 WAVE AT 3.338um.
CLEAR APERTURE: CENTRAL 0.800″ DIAMETER.
SURFACE FINISH: 60-40 PER MIL-PRF-13830, 2 FACES.
MATERIAL TYPE/QUALITY: SAPPHIRE, OPTICAL GRADE,
CRYSTALLOGRAPHIC ORIENTATION: M-PLANE
COATING: ANTIREFLECTIVE COATED FOR 0.25% MAXIMUM
REFLECTANCE PER SURFACE AT 3.338 MICRONS
WITH A NORMAL INCIDENCE ANGLE, APPLIED
TO BOTH FACES.