SCD3242-01A

SCD3244-01A

CONFIGURATION: DISC, PLANE-PARALLEL
DIAMETER: 0.500"+.000"/-.010"
OD FLAT: NONE, NOT REQUIRED.
THICKNESS: 0.1005" NOMINAL TO YIELD RETARDATION.
PARALLELISM: 2 ARC SECONDS MAXIMUM.
TRANSMITTED WAVEFRONT: 1/10 WAVE MAXIMUM AT 633nm.
RETARDATION TOLERANCE: +/- 1/300 WAVE
SURFACE QUALITY: 60-40 PER MIL-PRF-13830, 2 FACES.
CLEAR APERTURE: CENTRAL 0.375" OF DIAMETER FACES.
MATERIAL TYPE/QUALITY: SAPPHIRE, OPTICAL GRADE.
CRYSTALLOGRAPHIC ORIENTATION: M-PLANE
COATING: DUAL-BAND ANTIREFLECTIVE COAT MAXIMUM
TRANSMISSION AT BOTH 2090nm AND ALSO
4600mm WITH A NORMAL INCIDENCE ANGLE,
APPLIED TO BOTH FACES.

SCD2725-01A

CONFIGURATION: DISC, PLANE-PARALLEL
DIAMETER: 0.500"+/-.002"
THICKNESS: 0.067" NOMINAL TO YIELD RETARDATION TOL
EDGE BEVEL: 0.005" MAXIMUM X 45deg, 2 PLACES.
RETARDATION: 25/2 WAVES AT 1064 NANOMETERS.
17/2 WAVES AT 1550 NANOMETERS.
RETARDATION TOLERANCE: LAMBDA/150
MATERIAL TYPE/QUALITY: SAPPHIRE, OPTICAL GRADE.
CRYSTALLOGRAPHIC ORIENTATION: M-PLANE
COATING: DUALBAND ANTIREFLECTIVE COATING FOR
< 0.5% R AT BOTH 1064nm AND 1551nm WITH A
COATING DAMAGE THRESHOLD FOR 10-ns PULSES
AT 100 Hz >5 J/cm FOR 1064 nm OPO PUMP
AND 3 J/cm2 FOR 1551 OPO SIGNAL. COATING
MUST SURVIVE LONG TERM OPERATION AT FULL
POWER AT SPECIFIED FLUENCES AND
REPETITION RATE.

SCD1970-01A

CONFIGURATION: DISC, PLANE-PARALLEL
DIAMETER: 0.500"+.000"/-.005"
OD FLAT: NONE
THICKNESS: 0.022" NOMINAL TO YIELD RETARDATION TOL
PARALLELISM: 2 ARC SECONDS MAXIMUM.
T.W.E: 1/10 WAVE MAXIMUM AT 632.8nm.
RETARDATION TOLERANCE: +/- 1/400 WAVE
CLEAR APERTURE: CENTRAL 85% OF DIAMETER FACES.
MATERIAL TYPE/QUALITY: SAPPHIRE, OPTICAL GRADE.
CRYSTALLOGRAPHIC ORIENTATION: M-PLANE
COATING: ANTIREFLECTIVE "V" COAT FOR MAXIMUM
TRANSMISSION AT 1.064 MICRONS WITH A
NORMAL INCIDENCE ANGLE, APPLIED TO
BOTH FACES.

SCD2346-01A

CONFIGURATION: DISC, PLANE-PARALLEL
DIAMETER: 0.500"+/-.002"
MARKING: SMALL OD FLAT INDICATING THE PROJECTION
OF THE C-AXIS.
THICKNESS: 0.102"NOM TO YIELD RETARDATION TOL
EDGE BEVEL: 0.005" MAXIMUM X 45deg, 2 PLACES.
RETARDATION: 79/2 WAVES AT 532 NANOMETERS.
51/2 WAVES AT 803 NANOMETERS.
RETARDATION TOLERANCE: LAMBDA/300
MATERIAL TYPE/QUALITY: SAPPHIRE, OPTICAL GRADE.
CRYSTALLOGRAPHIC ORIENTATION: M-PLANE
COATING: DUALBAND ANTIREFLECTIVE COATING FOR
LESS THAN 0.5% REFLECTANCE AT BOTH
532nm AND 803nm WITH A NORMAL INCIDENCE
ANGLE, APPLIED TO BOTH FACES.

SCD1965-01B

CONFIGURATION: DISC, PLANE-PARALLEL
DIAMETER: 0.500"+.000"/-.010"
OD FLAT: NONE
THICKNESS: 0.022" NOMINAL TO YIELD RETARDATION TOL
PARALLELISM: 2 ARC SECONDS MAXIMUM.
T.W.E: 1/10 WAVE MAXIMUM AT 632.8nm.
RETARDATION TOLERANCE: +/- 1/1200 WAVE
CLEAR APERTURE: CENTRAL 85% OF DIAMETER FACES.
MATERIAL TYPE/QUALITY: SAPPHIRE, OPTICAL GRADE.
CRYSTALLOGRAPHIC ORIENTATION: M-PLANE
COATING: ANTIREFLECTIVE "V" COAT FOR MAXIMUM
TRANSMISSION AT 3.388 MICRONS WITH A
NORMAL INCIDENCE ANGLE, APPLIED TO
BOTH FACES.

SCD2073-01A

CONFIGURATION: DISC, PLANE-PARALLEL
DIAMETER: 0.500"+/-.002"
MARKING: SMALL OD FLAT INDICATING THE PROJECTION
OF THE C-AXIS.
THICKNESS: 0.192" NOMINAL TO YIELD RETARDATION TOL
EDGE BEVEL: 0.005" MAXIMUM X 45deg, 2 PLACES.
RETARDATION: 73/2 WAVES AT 1053 NANOMETERS.
49/2 WAVES AT 1556 NANOMETERS.
RETARDATION TOLERANCE: LAMBDA/350
MATERIAL TYPE/QUALITY: SAPPHIRE, OPTICAL GRADE.
CRYSTALLOGRAPHIC ORIENTATION: M-PLANE
COATING: DUALBAND ANTIREFLECTIVE COATING FOR
LESS THAN 0.5% REFLECTANCE PER SURFACE
AT BOTH 1053nm AND 1556nm WITH A NORMAL
INCIDENCE ANGLE, APPLIED TO BOTH FACES.

SCD2719-01A

CONFIGURATION: DISC, PLANE-PARALLEL
DIAMETER: 0.500"+.000"/-.010"
OD FLAT: NONE
THICKNESS: 0.025" NOMINAL TO YIELD RETARDATION TOL
PARALLELISM: 2 ARC SECONDS MAXIMUM.
T.W.E: 1/10 WAVE MAXIMUM AT 632.8nm.
RETARDATION TOLERANCE: +/- 1/1200 WAVE
CLEAR APERTURE: CENTRAL 85% OF DIAMETER FACES.
MATERIAL TYPE/QUALITY: SAPPHIRE, OPTICAL GRADE.
CRYSTALLOGRAPHIC ORIENTATION: M-PLANE
COATING: ANTIREFLECTIVE "V" COAT FOR MAXIMUM
TRANSMISSION AT 3.175 MICRONS WITH A
NORMAL INCIDENCE ANGLE, APPLIED TO
BOTH FACES.

SCD2350-01A

CONFIGURATION: DISC, PLANE-PARALLEL
DIAMETER: 70.00mm + 0.00mm /- 0.12mm
MARKING: SMALL OD FLAT INDICATING THE PROJECTION
OF THE C-AXIS.
THICKNESS: 3.2mm NOMINAL TO YIELD RETARDATION TOL
EDGE BEVEL: 0.13mm MAXIMUM X 45deg, 2 PLACES.
RETARDATION: 25 LAMBDA/4
RETARDATION TOLERANCE: LAMBDA/1000
SURFACE QUALITY: 60-40 PER MIL-PRF-13830, 2 FACES.
MATERIAL TYPE/QUALITY: SAPPHIRE, OPTICAL GRADE.
CRYSTALLOGRAPHIC ORIENTATION: M-PLANE
COATING: ANTIREFLECTIVE COATING FOR 0.50% MAXIMUM
REFLECTANCE PER SURFACE FROM 3.0 TO 5.0
MICRONS WITH A NORMAL INCIDENCE ANGLE,
APPLIED TO BOTH FACES.