SCD4460-WIT1

Witness Sample – Polished One Face

Diameter: 36.00mm +/- 0.30mm
Thickness: 6.98mm +/- 0.20mm
Edge Bevel: Light Protective Bevel, Both Edges
Parallelism: < 2 Arc Minutes
Transmitted Wavefront Error: N/A
Surface Quality: 60-40 per MIL-PRF-13830, One Face
Other Face Fine Ground
Surface Roughness: < 50 Angstroms RMS, Polished Face
Clear Aperture: Central 29.62 Minimum Diameter, Both Faces
Material Type / Quality: Sapphire, Optical Grade,
GT Crystal Systems Low Absorption
Optical Sapphire (LAOS)
Crystallographic Orientation: c-Plane
Coating: None, Not Required