CONFIGURATION: DISC, PLANE-PARALLEL
DIAMETER: 0.500″+/-.002″
MARKING: SMALL OD FLAT INDICATING THE PROJECTION
OF THE C-AXIS.
THICKNESS: 0.192″ NOMINAL TO YIELD RETARDATION TOL
EDGE BEVEL: 0.005″ MAXIMUM X 45deg, 2 PLACES.
RETARDATION: 73/2 WAVES AT 1053 NANOMETERS.
49/2 WAVES AT 1556 NANOMETERS.
RETARDATION TOLERANCE: LAMBDA/350
MATERIAL TYPE/QUALITY: SAPPHIRE, OPTICAL GRADE.
CRYSTALLOGRAPHIC ORIENTATION: M-PLANE
COATING: DUALBAND ANTIREFLECTIVE COATING FOR
LESS THAN 0.5% REFLECTANCE PER SURFACE
AT BOTH 1053nm AND 1556nm WITH A NORMAL
INCIDENCE ANGLE, APPLIED TO BOTH FACES.