CONFIGURATION: DISC, PLANE-PARALLEL
DIAMETER: 0.500″+/-.002″
MARKING: SMALL OD FLAT INDICATING THE PROJECTION
OF THE C-AXIS.
THICKNESS: 0.102″NOM TO YIELD RETARDATION TOL
EDGE BEVEL: 0.005″ MAXIMUM X 45deg, 2 PLACES.
RETARDATION: 79/2 WAVES AT 532 NANOMETERS.
51/2 WAVES AT 803 NANOMETERS.
RETARDATION TOLERANCE: LAMBDA/300
MATERIAL TYPE/QUALITY: SAPPHIRE, OPTICAL GRADE.
CRYSTALLOGRAPHIC ORIENTATION: M-PLANE
COATING: DUALBAND ANTIREFLECTIVE COATING FOR
LESS THAN 0.5% REFLECTANCE AT BOTH
532nm AND 803nm WITH A NORMAL INCIDENCE
ANGLE, APPLIED TO BOTH FACES.