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SCD4219-WIT

Diameter: 1.001″+/-.001″
Thickness: 0.200″+/-.010″
Parallelism: 5 Arc Seconds Maximum.
Edge Bevels: 0.020″Maximum Face Width x 45 Degrees, Both Edges
Flatness: < 0.30um RMS @ 633nm, Both Faces
Surface Quality: 40-20 Per MIL-PRF-13830, Both Faces
Surface Roughness: < 20 Angstroms RMS, Both Faces
Clear Aperture: Not Specified
Material Type / Quality: Sapphire, Optical Grade 1 or 2
Material to Be From Same Boule
Used to Produce SCD4219-02A.
Crystallographic Orientation: c-Plane
Coating: None, Uncoated Substrate

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