MELLER OPTICS VERIFIES CRYSTALLOGRAPHIC ORIENTATION

A new service that precisely measures the complete lattice orientation of single crystals and provides a misalignment report of tilt and azimuth has been introduced by Meller Optics, Inc. of Providence, Rhode Island.

Meller Optics’ X-Ray Goniometry Service measures the complete lattice orientation of single crystals with precision up to (1/100)° and provides a misalignment report of tilt and azimuth. It is typically performed to validate orientation when thermal-expansion, -coefficient, and the index of refraction needs to be constant in all directions, and when birefringence must be minimum or maximum, and polarization effects are critical.

Ideal for sapphire, single-crystal quartz, silicon, MgF2, CaF2, BaF2, spinel and other materials, Meller Optics’ X-Ray Goniometry Service can be performed with material samples ranging from 0.25” sq. up to 20kg ingots and can also machine mark the orientation and apply a reference flat.

Meller Optics’ X-Ray Goniometry Service is priced depending upon customer requirements with a report offered within a week.